Electron microscopes are indispensable tools for todays nano technology development and production. Scanning electron microscopes (SEM) deliver high resolution surface information and are widely used in many applications fields:
The addition of analytical detectors enables full nano structural analysis.
- - materials analysis
- - life sciences
- - semiconductor technology
- - quality assurance.
The Carl Zeiss CrossBeam® line covers a complete range of unique instruments.
Starting from the unique NEON® platform approach that allows to individually tailor systems to customer applications in daily analytical work, sample preparation and high performance imaging and ranging
to the NVision 40 workstation for highest demands in imaging and unparalleled ion beam performance.
The unique CrossBeam® line combines the unequalled imaging power of the proprietary GEMINI® field emission
technology with the sophisticated high performance focussed ion beam column into one extraordinary powerful system.
The transmission electron microscope (TEM) uses electron translucent specimens with images directly projected on a screen or camera. Resolution better than 0.1 nm are now achievable, delivering atomic scale resolution.
The all new LIBRA® range of Energy Filtering Transmission Electron Microscopes (EFTEM) combine state of the art electron optics with unique Koehler illumination, OMEGA In-column energy filtering, extremely stable digital electronics and genuine ease of operation.
The systems are operated through a pair of dedicated control panels supported by the WinTEM™ GUI following the successful philosophy of ZEISS´ SEMs instruments for maximum convenience and consistent “look-and-feel” operation across the entire product range.
The flexible and versatile ORION™ microscope is capable of providing a wide variety of analytical information, including: topographic, material, voltage contrast, crystallographic, surface and sub-surface. It e esily can even handle samples that tend to charge.