Local Charge Compensation

Field Emission - Scanning Electron Microcopes (FE-SEM) from Carl Zeiss

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Andre nyheder

MIK | 01-02-2012

Did you know ...

... that microscopes can reveal a battery's age?
 
Hver måned trækker vi lod om et par TAG Heuer solbriller fra SQUADRA serien til en værdi af 1.900,- kr. blandt alle, der har tilmeldt sig nyhedsgruppen om "Lysmikroskopi, Elektron- og Konfokal Mikroskopi, Anatomisk Patologi og Spektralanalyse"
 
MIK | 19-09-2011

Fascinating Nano World

Microscopy Conference 2011 in Kiel
 
Disse små fugle, som kun bliver 11 cm lange og kun vejer 20 gram, er let genkendelige på deres lyse, røde næb og på hannernes typiske zebramønster på brystet – heraf deres navn.
 
Det kan lade sig gøre med de nyeste prototyper af elektronmikroskoper.
 

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Ultra FESEM serien

The ULTRA FESEM, based on the SUPRA™ FESEM represents the ultimate nano structural analysis E-beam tool which delivers high efficiency, ultra high resolution imaging.
ULTRA FESEM
ULTRAplus_detail

The newly developed Energy selective Back-scattered (EsB) and Angle selective Backscattered (AsB) detectors represent the latest developments of the renowned GEMINI® technology.

The ULTRA incorporates the GEMINI® In-lens SE detector for crisp topographic imaging, the EsB detector for clear com-positional contrast and the AsB detector for crystollagraphic information.

Simultaneous real-time imaging and mixing of signals offers ultimate imaging capabilities. The EsB detector comprises a filtering grid which enables high resolution BSE imaging revealing previously unseen image details.

Features:

  • Ultra high resolution SE and BSE imaging at low kV
  • High efficiency EsB /AsB detectors for nano-scale compositional contrast
  • Extra large motorised eucentric stages with precise control
  • Real-time imaging and mixing of BSE and SE signals
  • Suppresses charging effects on non-conducting specimens
  • Ultra stable current mode for X-ray analysis and EBSD applications