ZEN for Material Applications
ZEN - Efficient Navigation for Material Applications: One glance at the neat, clearly structured user interface of ZEN will convince you.
The screen is organized into three areas, following the workflow typical of your
experiments. With ZEN we have made it possible for the user to focus on the
essentials. Discover a new era in Laser Scanning Microscopy
Topography package
computation and visualization of surfaces (fast rendering modes) and height profiles, plus many measurement functions (roughness, surface area, volume)
Geometric parameters
- Length
- Width
- Height
- Profile angle (edge slope)
- Radius of curvature
- Peripheral distance
- Area
|
|
Roughness parameters
- Volume
- Mean height
- Arithmetic mean deviation
- Root-mean-square deviation
- Skewness
- Kurtosis
- Maximum peak heigh
- Maximum valley depth
- Absolute roughness depth (peak-to-valley value)
- Average roughness depth
- Maximum roughness depth
|
|
Functional parameters
- Surface bearing area
- Surface bearing area ratio
- True surface
- Developed surface area ratio
- (surface index
- (Material volume (ratio)
- Void volume (ratio)
|
Topographic Parameters contained in the LSM 700 Software: ZEN
All roughness parameters can be computed as primary data, roughness or waviness-filtered data, for 2D profile or for 3D surfaces.
StitchArt plus package
Capture of multiple XZ profiles and multiple XYZ stacks with reflected lightCapture of multiple XZ profiles and multiple XYZ stacks with reflected light.
LSM Image VisArt plus
Fast 3D and 4D reconstruction and animation (shadow and transparency projection, surface and mixed rendering modes, cutting planes, fly-through mode, distance measurement in 3D)
3D for LSM
3D presentation and measurement of volume data records, on request3D presentation and measurement of volume data records, on request.